2012-№1(34) Article 16

V.V. Gudzev, V.G. Litvinov, M.V. Zubkov

Automatic measuring and computing complex for deep-level relaxation spectroscopy. p. 158-167

Скачать статью

UDC 621.315.592

 

The article focuses on the physical laws of deep-level relaxation spectroscopy. It provides a description of an automatic measuring and computing complex for relaxation spectroscopy of deep levels in semiconductor barrier structures.

 

deep layers, deep centers, capacity relaxation, current relaxation.

 

References

1. Vyvenko, O.F. Optimizacija korreljacionnoj procedury v metodah termostimulirovannoj relaksacionnoj spektroskopii poluprovodnikov [The optimization of the correlated procedure in the methods of thermostimulated relaxational spectroscopy of semiconductors]. Vyvenko O.F., Istratov A.A. Fizika i tehnika poluprovodnikov [Physics and technology of semiconductors], 1992, vol. 26, no. 10, p.1693.

2. Denisov, A.A. Relaksacionnaja spektroskopija glubokih urovnej. Obzory po jelektronnoj tehnike [Relaxational spectroscopy of deep levels. Reviews on Electronic Engineering]. Denisov A.A., Laktjushkin V.N., Sadof’ev Ju.G.. CNII “Jelektronika” [The CRI “Electronics”]. Moscow, 1985, no. 15/144, 52 p.(Serija “Tehnologija, organizacija proizvodstva i oborudovanie” [The set “Technology, organization of production and equipment”]).

3. Labutin, A.V. Avtomatizirovannyj izmeritel’no-analiticheskij kompleks tokovoj relaksacionnoj spektroskopii glubokih urovnej [Automated measuring-analytical complex of current relaxational spectroscopy of deep levels]. Labutin A.V., Litvinov V.G., Kozlovskij V.I., Gudzev V.V., Zubkov M.V.. Informacionnyj listok o NTR [Fact sheet of STR]. Rjazanskij CNTI [Ryazan STIC]. Ryazan, 2002, no. 61-081-02, 4 p.

Uncategorized