2012-№1(34) Article 15

I.A. Zeltser, E.N. Moos

Methodological and instrument aspects of structural-sensitive x-ray spectroscopy of the surfaces of condensed media and nanostructures (part 2). p. 145-158

UDC592:539.2:573.533.2

 

The paper analyzes the method of structural-sensitive x-ray spectroscopy of solid surfaces and describes the method of x-ray photoelectron spectroscopy. The article also treats new methods of semiconductor investigation, it analyzes pre-threshold trigger and electron emission caused by continuous resonance combinational dispersion.

 

structural-sensitive spectroscopy, x-rays, ion, electron, vacuum, emission, atomic particles, X-ray diffraction, synchrotron radiation, auger-electron.

 

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